UDC 519.7
ENTROPY CRITERION BASED ON BINARY MATRIX SYMMETRY MEASURE
G. V. Petrukhnova, Ph.D. (Tech.), Associate Professor, Voronezh State Technical University, Voronezh, Russia; This email address is being protected from spambots. You need JavaScript enabled to view it.
The aim of the work is to solve the problem of optimizing the structure of a binary matrix. The relevance of entropy criteria usage in complex systems modeling of different nature is shown. The structural entropy concept is based on the symmetry concept. The symmetry reflects some orderliness of the object parts under study. Symmetry minimum allows you to get the maximum variety of object structural elements. The binary matrix structure invariance with respect to the selected structural elements permutations is considered. A minimal unit of binary matrix partitioning in the constructed model is its row. Rows permutations among themselves and elements permutations in rows are considered. On the basis of performed binary matrix structuring, a measure of its symmetry is introduced. A symmetry measure allowed to synthesize quality entropy criteria. The efficiency of using the obtained simulation results in theory and practice of digital devices test control is introduced. A digital device model «black box» was considered. Based on pseudorandom number generator, digital devices tests covering single faults of «short circuit» and «constant» types were built. It was assumed that a fault of «short circuit» type can occur between any tested digital circuit control points, a «constant» type fault can occur at any control point. The experimental data analysis showed that the obtained entropy criteria allowed to reduce digital devices tests length.
Key words: entropy, symmetry, binary matrix, measure of object symmetry, digital circuit, pseudorandom number generator, fault of «short circuit» type, fault of «constant» type.