UDC 631.382
STUDY OF MICROWAVE TRANSISTOR MEASUREMENT SMOOTHING ALGORITHMS FOR SMALL-SIGNAL NOISE MODELING
D. V. Bilevich, Junior Researcher at «50ohm Lab», Tomsk, Russia;
orcid.org/0000-0001-7421-7403, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
А. А. Popov, Junior Researcher at «50ohm Lab», Tomsk, Russia;
Or cid.org/0000-0001-6010-4459, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
I. M. Dobush, Ph.D. (Tech.), Senior Researcher at «50ohm Lab», TUSUR, Томск, Россия;
orcid.org/0000-0002-3626-1419
A. E. Goryainov, Ph.D. (Tech.), Senior Researcher at «50ohm Lab», TUSUR, Tomsk, Russia;
orcid.org/0000-0003-3363-407X, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
Y. A. Novichkova, bachelor at TUSUR, Tomsk, Russia;
orcid.org/0000-0002-7987-7192, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
The problem of preliminary processing of measurement results of a microwave transistor in terms of building a small-signal noise model with subsequent application of these models in design process is studied. The aim is to verify the applicability of methods for removing noise from measured data in the process of building small-signal noise models of a transistor. A preliminary check of four smoothing methods on artificially noisy model data was carried out. It was found that the error in removing noise by the Savitsky-Golay method on artificially noisy data does not exceed 2.5 %. The applicability of the method was experimentally verified by constructing a small-signal noise model of microwave transistor. Using the constructed model, the design and the subsequent manufacture of test monolithic integrated circuit (MIC) of a two-stage low noise amplifier was carried out. The deviation of measurement results from simulation results was less than 10 % for both gain and noise figures. This suggests that it is possible to apply smoothing procedure to measurements of noise figure by the Savitsky-Golay method in the process of building a small-signal noise model.
Key words: small-signal model of transistor, noise model of transistor, noise figure, smoothing technique, low noise amplifier.