UDC 621.317.1: 621.3.087.92
METROLOGICAL TEST METHOD EFFICIENCY ANALYSIS WHEN CALCULATING ADC INTEGRAL NONLINEARITY
А. M. Abramov, Ph.D. (Tech.), Associate Professor, Department of IIBMT, RSREU, Ryazan, Russia; orcid.org/0009-0006-7274-5206, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
The paper considers the problem of modeling a new method of ADC metrological testing, which reduces the requirements for reference measuring instruments in terms of accuracy class taking into account nonlinear component of measurement signal (MS). The aim of the work is to evaluate the effectiveness of a new method by means of simulation modeling in LabVIEW graphic programming environment, by comparing the calculated one with the given (true) integral nonlinearity (INL) of ADC. Modeling was carried out on real conversion function (CF) of 12-bit ADC at various combinations of average number of ADC code appearances per quantization interval and additive noise amplitude. The maximum deviation of real shape of generated MS from ideal linear shape was 2 % of MS input range. The simulation results have shown that a new method can accurately estimate ADC integral nonlinearity with an error of less than 1 LSB (least significant bit).
Key words: : modeling, analog-to-digital converter, measuring signal, integral nonlinearity, error, modulus, histogram, time, code.