UDC 621.317.1: 621.3.087.92
INFLUENCE OF NON-STATIONARY EFFECTS OF TEST ENVIRONMENT ON THE ACCURACY OF RELATED HISTOGRAM METHOD FOR ADC METROLOGICAL TESTS
А. M. Abramov, Ph.D. (Tech.), Associate Professor, Department of IIBMT, RSREU, Ryazan, Russia; orcid.org/0009-0006-7274-5206, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
The problem of determining the requirements to metrological test system hardware by method of cou pled histograms to ensure the accuracy of measuring integral nonlinearity (INL) of ADC at the level of 1LSB (least significant bit) is considered. The aim of the paper is to evaluate the accuracy of coupled histogram method under non-stationary effects of test environment. Dependences for method of coupled histograms are found, showing that the error in determining INL of ADC when measuring signal (MS) is shifted up or down is determined by the ratio of maximum drift of MS reference level to the product of MS offset voltage by nom inal quantization interval of ADC. The method of reducing the influence of non-stationary effects of test envi ronment on the accuracy of coupled histograms method is proposed, which consists in combining INL func tions obtained by shifting reference level of original MS downward and upward, and averaging their com mon part.
Key words: : non-stationary effects, metrological test system, analog-to-digital converter, measuring sig nal, integral nonlinearity, estimation error, histogram, code transition time, digital-to-analog converter.