UDC 621.38
RADIATION TOLERANCE OF AN ELECTRONIC DEVICE UNDER EXPOSURE TO SPACE RADIATION
D. S. Bogdanov, design engineer, JSC «SRC «Progress», Samara, Russia;
orcid.org/0000-0002-5405-7438, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
I. A. Bogdanova, design engineer, JSC «SRC «Progress», Samara, Russia;
orcid.org/0000-0001-5056-0303, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
A. N. Volnykin, design engineer, JSC «SRC «Progress», Samara, Russia;
orcid.org/0000-0002-1421-3870, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
The article gives an examination of estimation routine for fulfilling requirements to radiation tolerance of an onboard electronic device under exposure to space radiation. The article aims to conduct an example of estimation procedure of radiation tolerance and its correspondence to given requirements (for TID and SEE). The article also aims to reveal certain estimation aspects which are to be corrected. The article shows an example of practical application of estimation methods for correspondence of calculated values and given requirements for such types of ionizing radiation as: electron and proton flows of Van Allen radiation belts, solar energetic particles, HZE particles and high energy protons. The article gives several examples of components which are potentially sensitive to space radiation. For such cases the article shows possible hardening measures. The conclusion shows the necessity and sufficiency of exact actions.
Key words: radiation tolerance, total irradiation dose (TID), TID effects, single event effects (SEE), Van Allen radiation belt, solar energetic particles, high energy protons, HZE particles, single event upset (SEU), failure rate.