UDC 621.382
ELECTRICAL IC TRIMMING METHOD USING POLYSILICON FUSES
M. K. Burukhin, Engineer, JSC «OKB MEL», Kaluga, Russia;
orcid.org/0009-0002-9707-5406, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
S. V. Ryzhov, Engineer, JSC «OKB MEL», Kaluga, Russia;
orcid.org/0000-0001-5330-2537, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
D. V. Andreev, Kaluga Branch of BMSTU, Kaluga, Russia;
orcid.org/0000-0001-9080-1028, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
M. V. Romanov, Head of Department, JSC «OKB MEL», Kaluga, Russia;
orcid.org/0000-0003-1898-5939, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
This article provides a detailed overview of the method of trimming integrated circuits (ICs) using polysilicon fuse jumpers. The aim is to develop and apply a modified trimming method using burnt-out jumpers in reference voltage amplifier circuit. The use of trim to achieve the required reference voltage in op-amp circuit is investigated and the corresponding calculations are presented. As part of the study, experimental tests were carried out with test modules, on which the jumper burnout mode was worked out and their resistance was measured. The results of the study confirmed the effectiveness of applying polysilicon burn-out jumpers in trimming process. To facilitate calculations and analysis, a special calculator application has been developed. In addition, the results of modeling the trimming process for different initial values of parameters using Monte Carlo method are presented. The obtained results confirm the efficiency of the method proposed and its applicability in practice
Key words: : technological variation of parameters, IC trimming, polysilicon fuses, Symica DE.